Abstract
Epitaxial YBa2Cu3O7−X (YBCO) films were produced on non‐buffered (100) single crystal LaAlO3 using the metal organic deposition (MOD) method with fluorinated metal acetates. In an effort to enhance the in‐field performance of the films, Sm and Nd acetates were fractionally substituted for Y acetate in a series of precursor solutions to incorporate an array of nanoscale flux pinning centers in the post‐annealed films. From measurements taken in the non‐optimized films a 50%–150% improvement in critical current density at 77K in fields up to 1T were found for films with a 1/3 substitution of the Rare Earth elements, with further improvements at 40K. Furthermore, a study of the microstructure of the films by scanning electron microscopy (SEM) reveals the presence of nanoparticles on the surfaces of the films.
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