Abstract

We examine in this work the role of disorder in contributing to the sluggish relaxation observed in intrinsic electron glasses. Our approach is guided by several empirical observations: First and foremost, Anderson localization is a pre-requisite for observing these nonequilibrium phenomena. Secondly, sluggish relaxation appears to favor Anderson insulators with relatively large Fermi energies (hence proportionally large disorder). These observations motivated us to consider a way to measure the underlying disorder in a realistic Anderson insulator. Optical studies using a series of amorphous indium oxide (${\mathrm{In}}_{x}\mathrm{O}$) establish a simple connection between carrier concentration and the disorder necessary to approach the metal-insulator transition from the insulating side. This is used to estimate the typical magnitude of the quenched potential fluctuation in the electron-glass phase of this system. The implications of our findings on the slow dynamics of Anderson insulators are discussed. In particular, the reason for the absence of a memory dip and the accompanying electron-glass effects in lightly-doped semiconductors emerges as a natural consequence of their weak disorder.

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