Abstract
Divided aperture (DA) technology enhances the depth and anti-scattering capability in microscopy while slightly off-axis digital holographic microscopy improves the input-plane field of view (FOV) utilisation and optimises the detector measurement bandwidth. In this work, we propose a micro-imaging system utilising these two methods to perform full-field 3D topography measurements without any scanning. The DA eliminates the need for element tilts, pinholes, and gratings to produce an angle between the sample and reference beams. Two π/2-phase-shifted interferograms are obtained with polarising elements in one shot. Experiments are performed to prove the feasibility and validity of the proposed method.
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