Abstract
Elemental Cu nanocrystals were synthesized in thin film SiO2 by ion implantation and thermal annealing. The local atomic structure and nanocrystal size distribution were investigated by means of extended X-ray absorption fine structure (EXAFS) spectroscopy and small angle X-ray scattering (SAXS), respectively. We quantify the bondlength contraction and increased structural disorder in the nanocrystals as compared to a bulk Cu reference. Both are proportional to the inverse of the nanocrystal diameter, which in turn is proportional to the surface-area-to-volume ratio. In particular we show that a simple liquid-drop model can explain the bondlength contraction and estimate the surface tension of nanocrystalline Cu to be 3.8±0.4J/m2.
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