Abstract
Thin Films In article number 2210562, Ruijuan Xu, Kevin J. Crust, Varun Harbola, and co-workers report intrinsic size-driven scaling in lead-free antiferroelectric thin films. They demonstrate an intriguing antiferroelectric-to-ferroelectric transition upon reducing the thickness of antiferroelectric NaNbO3 membranes. The image shows the coexistence of ferroelectric and antiferroelectric phases in freestanding NaNbO3 membranes.
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