Abstract

AbstractBi single crystals of high perfection (having extremely high resistance ratios r4.2 = ϱ290 K/ϱ4.2 K) are grown by the mould growing method. In these crystals, the thickness dependence of the resistance ratio r4.2 and the temperature dependence of the electrical resistance are investigated in a temperature range between 2 and 77 K. In the range of the diffusion size effect, a markedly different behaviour is found to occur in the thickness dependence of the two crystal orientations investigated (j ‖ C3; j ‖ C2). An anisotropy of the slope of the T2‐terms is detected in the temperature dependences of the electrical resistance in the temperature interval from 2 to 16 K.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.