Abstract
We report on the design of a diffractometer, which offers improved capabilities for x-ray experiments in ultrahigh vacuum. Its main features are (i) the possibility to follow the evolution of diffraction spots in situ during adsorption or film deposition; (ii) the measurement of reflections at high exit angles, i.e., large perpendicular momentum transfer. This goal is achieved by placing a movable x-ray detector inside the vacuum chamber. (iii) Other surface analysis equipment, e.g., a low-energy electron diffraction or an electron energy analyzer can be moved in front of the sample and operated simultaneously with x-ray diffraction. (iv) A load lock system—currently in preparation—will allow the quick exchange of samples without breaking system vacuum. In addition, a new design of the chi circle used for sample alignment provides a compact, space-saving design of the diffractometer.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
