Abstract
Atom probe tomography is a powerful technique that is highly suited to the study of low-level grain boundary segregation. However, difficulties in preparation of the required needle-shaped specimens containing the area of interest have precluded detailed studies of this nature to date. Two new methods are presented to manufacture atom probe tips from site-specific areas using a dual-beam focused ion beam (FIB)/scanning electron microscope (SEM). One involves the use of electropolished blanks, which are resharpened using the ion beam, and the second utilises micromanipulators to lift the area of interest directly from a bulk specimen before ion beam fabrication of the tip. The advantages and drawbacks of each technique are compared.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
