Abstract
For different applications in laser photonics and integrated optics, photorefractive materials are surely of great interest and play an important role in miniaturization of devices and fabrication of functional photonic structures such as gratings and waveguides. In this work, high photorefractivity of sol-gel derived SiO2-SnO2:Er3+ glass-ceramic planar waveguides, with negative effective refractive index change, is demonstrated. Through the photorefractivity investigation employing the UV pulsed KrF excimer laser (λ = 248 nm), the glass-ceramic planar waveguides show fast photorefractive response after a cumulative dose of only 0.3 kJ/cm2. A higher SnO2 content in the glass-ceramics leads to a greater change of saturated effective refractive index: Δneff = - (2.60 ± 0.20) x 10-3 at 1550 nm on the TE0 mode, for the 30 mol% SnO2 planar waveguides and Δneff = - (2.00 ± 0.20) x 10-3 on the 1550 nm TE0 mode, for the 20 mol% SnO2 ones. To investigate the structural modifications involved in the photorefractivity of the SiO2-SnO2:Er3+ glass-ceramics, XRD and Raman characterizations are employed. The grating fabrication by direct UV writing on the SiO2-SnO2:Er3+ glass-ceramic planar waveguide as well as an important reduction in the employed energy is demonstrated.
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