Abstract

Sinusoidal signal can be used as stimulus to test static and dynamic parameters of ADC. A sigma-delta modulation based sinusoidal signal generator for ADC testing in SOC was introduced. The generator was built on the same chip with ADC. A numerical resonator generated a sinusoidal signal which was converted to a single bitstream by a sigma-delta modulator. Due to oversampling, the quantization noise was pushed to high frequency range. A high-quality sinusoidal signal was generated by low-pass filtering the bitstream. The sigma-delta modulator was inserted into the resonator to decrease silicon area overhead and calculate time. A cascaded integrator comb decimation filter was used as the low-pass filter. The amplitude and frequency of the output sinusoidal signal could be accuratly set by digital parameter of the generator to meet the requirement of static and dynamic performances testing. DOI: http://dx.doi.org/10.11591/telkomnika.v11i7.2818

Full Text
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