Abstract
Low-permittivity SrMgSi2O6 microwave dielectric ceramics were synthesized via a conventional solid-state reaction method. Further, their sintering behavior as well as structural and microwave dielectric properties were studied. The x-ray diffraction patterns of the SrMgSi2O6 and Sr2MgSi2O7 ceramics were compared; both the samples were confirmed to be tetragonal. Meanwhile, the microwave dielectric properties of the samples were related to their microscopic morphology. In addition, the SrMgSi2O6 ceramics had a low sintering temperature of 1125°C; they exhibited good microwave dielectric performances with a relative permittivity of er = 6.7, a quality factor Q × f = 25,800 GHz, and temperature coefficient of the resonator frequency τf = −46 ppm/°C. Therefore, the ceramics exhibit potential for application in microwave devices.
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