Abstract
In order to improve the performance of the accuracy and efficiency for analyzing the microstrip structure, a singularity processing method is proposed theoretically and experimentally based on the fundamental locally one-dimensional finite difference time domain (LOD-FDTD) with second-order temporal accuracy (denoted as FLOD2-FDTD). The proposed method can highly improve the performance of the FLOD2-FDTD even when the conductor is embedded into more than half of the cell by the coordinate transformation. The experimental results showed that the proposed method can achieve higher accuracy when the time step size is less than or equal to 5 times of that the Courant-Friedrich-Levy (CFL) condition allowed. In comparison with the previously reported methods, the proposed method for calculating electromagnetic field near microstrip line edge not only improves the efficiency, but also can provide a higher accuracy.
Highlights
In recent years, as a direct time-domain method for solving Maxwell differential equations, the finite-difference time domain (FDTD) has been extensively studied and widely used in all types of electromagnetic simulation problems
Railton proposed the modified assigned material parameters (MAMPs) method [3], which was implemented by the use of an appropriate permittivity and permeability on the material to characterize the singular behavior of the field near the edge
The MAMPs can provide a higher accuracy, without reducing the grid size, it was difficult to deal with the situation when the conductor was embedded into more than half of the cell and its computational efficiency was still limited by the CFL condition
Summary
As a direct time-domain method for solving Maxwell differential equations, the finite-difference time domain (FDTD) has been extensively studied and widely used in all types of electromagnetic simulation problems. Due to the CFL condition, fine grids would need small time step size, which results in a large resource usage for the conventional FDTD in calculating the microstrip structure. For these reasons, Taflove proposed a subgrid technique [2] which used fine grids near the edge of microstrip line to characterize a sharp variation of the electromagnetic field.
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