Abstract
A multi-aperture analyser set-up was recently developed for X-ray phase contrast imaging and tomography, simultaneously attaining a high sensitivity and wide dynamic range. We present a single-shot image retrieval algorithm in which differential phase and dark-field images are extracted from a single intensity projection. Scanning of the object is required to build a two-dimensional image, because only one pre-sample aperture is used in the experiment reported here. A pure-phase object approximation and a hierarchical approach to the data analysis are used in order to overcome numerical instabilities. The single-shot capability reduces the exposure times by a factor of five with respect to the standard implementation and significantly simplifies the acquisition procedure by only requiring sample scanning during data collection.
Highlights
Non-destructive inspection is often carried out using X-ray radiation because high resolution images can be obtained through significant thicknesses over a wide range of materials
X-ray imaging is applied across a huge variety of fields, such as medicine, materials engineering, biology, and security
A number of different approaches have been developed for X-ray Phase Contrast Imaging (XPCI), relying both on laboratory sources and synchrotron radiation facilities, including free-space propagation, crystal analysers, grating interferometry, and speckle-based methods [2,3,4,5,6,7,8,9,10,11,12,13,14,15,16,17,18]
Summary
Non-destructive inspection is often carried out using X-ray radiation because high resolution images can be obtained through significant thicknesses over a wide range of materials. X-ray imaging is applied across a huge variety of fields, such as medicine, materials engineering, biology, and security. A number of different approaches have been developed for X-ray Phase Contrast Imaging (XPCI), relying both on laboratory sources and synchrotron radiation facilities, including free-space propagation (with single-distance implementations), crystal analysers, grating interferometry, and speckle-based methods [2,3,4,5,6,7,8,9,10,11,12,13,14,15,16,17,18]. When compared to other full-field imaging techniques, having one pre-sample aperture imposes sample scanning to construct a planar, two-dimensional image. A phase retrieval and data processing scheme is presented, which provides differential phase and dark field images from a single detector exposure
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