Abstract

We have observed single‐domain (SD) like behavior in a 3‐mm natural single crystal of magnetite following low‐temperature demagnetization (LTD), which consists of zero‐field cycling through the Verwey transition to erase remanence carried by pinned domain walls. We compared stepwise alternating field (AF) and thermal demagnetization curves of 1‐mT total thermoremanent magnetization (TRM), 1‐mT partial TRM (pTRM) acquired between the Curie point (TC = 575°C) and 565°C, and saturation isothermal remanent magnetization (SIRM) measured with and without prior LTD. AF demagnetization curves of untreated TRM and SIRM decreased exponentially with increasing AF. SIRM was more resistant to demagnetization than was TRM, a multidomain (MD) result of the Lowrie‐Fuller test. After LTD the TRM and SIRM memories had AF demagnetization curves with sigmoid shapes and initial plateaus below 8 mT in which little or no demagnetization occurred. Both features are reminiscent of SD behavior. During thermal demagnetization, untreated TRM and SIRM decreased almost linearly with increasing temperature up to ≈500°C. Such distributed unblocking temperatures TUB are expected for pinned walls in MD grains. The remaining 60% of TRM and 40% of SIRM were lost over a narrow temperature interval concentrated between 560°C and TC. The TRM memory after LTD was very stable against thermal demagnetization. There was no decrease in remanence below 550°C and very little change until 565°C, only 10°C below TC. This very high TUB fraction of TRM seems to have SD‐like character. SIRM has similar behavior. In the case of pTRM, both the untreated remanence and the memory after LTD have almost entirely high TUBs, identical to the range of pTRM blocking temperatures TB, 565°C–TC. TUB = TB is a basic property of SD partial TRM. The pTRM memory fraction is also larger than that of total TRM or SIRM. These observations suggest that pTRM(TC, 565°C) isolates an SD‐like fraction of remanence similar to that constituting TRM and SIRM memory. The high AF coercivities of the TRM and SIRM memories indicate that the source of SD‐like behavior may be unusually strong domain wall pinning by crystal defects formed at monoclinic twin boundaries as a result of crystal distortion from cubic to monoclinic structure in passing through the Verwey transition.

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