Single trial analysis of event related potentials: non-linear de-noising with wavelets

Abstract

We present and apply a method for single trial analysis of event related potentials (ERPs) that combines techniques from non-linear time series analysis with the wavelet transform. For this method, convincing results have already been achieved for simulated data as well as for intracranially recorded ERPs (Physica D 140 (2000) 257). However, ERPs are affected by a variety of external and internal experimental parameters, which makes the appropriate configuration of single trial analysis difficult. Thus, several pitfalls may occur in realistic applications. In this paper, we applied the method of non-linear de-noising with wavelets to both intra- and extracranially recorded ERPs, and show examples of how and where this single trial analysis can be used to obtain additional information on dynamic neural processes.