Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector.

A Abboud,U Pietsch,L Strüder,J S Micha,R Hartmann,O Ulrich,C Kirchlechner,S Send,J Keckes,T Conka Nurdan

doi:10.1107/s1600576717005581

Abstract

The full strain and stress tensor determination in a triaxially stressed single crystal using X-ray diffraction requires a series of lattice spacing measurements at different crystal orientations. This can be achieved using a tunable X-ray source. This article reports on a novel experimental procedure for single-shot full strain tensor determination using polychromatic synchrotron radiation with an energy range from 5 to 23 keV. Microbeam X-ray Laue diffraction patterns were collected from a copper micro-bending beam along the central axis (centroid of the cross section). Taking advantage of a two-dimensional energy-dispersive X-ray detector (pnCCD), the position and energy of the collected Laue spots were measured for multiple positions on the sample, allowing the measurement of variations in the local microstructure. At the same time, both the deviatoric and hydrostatic components of the elastic strain and stress tensors were calculated.

Highlights

The mechanical properties of micrometre-sized materials, scaling from 0.1 to 10 mm, are of increasing importance owing to current developments in micro systems technology, nanoelectromechanical systems and downsized medical devices such as ‘implantable medical devices’
In this article we report the measurement of the full strain tensor by Energy-dispersive Laue diffraction (EDLD)
The strain and stress tensor values would be an average of the sampled volume

Summary

Introduction

The mechanical properties of micrometre-sized materials, scaling from 0.1 to 10 mm, are of increasing importance owing to current developments in micro systems technology, nanoelectromechanical systems and downsized medical devices such as ‘implantable medical devices’. In the past few decades, it has been discovered that the mechanical properties might change if the size of the specimen is reduced to the micrometre or nanometre scale (Fleck et al, 1994; Stolken & Evans, 1998; Haque & Saif, 2003; Uchic et al, 2004), driving further investigations. This includes structure analysis of materials on the micrometre scale. The basics for determining the full strain tensor components, both the deviatoric and hydrostatic parts, conceptually are well understood (Chung & Ice, 1999; Busing & Levy, 1967; Rollett, 1965), there has been no experimental realization of a single-shot measurement

Methods

Results

Conclusion