Abstract
Aperture-scanning Fourier ptychography [Opt. Express22, 13586 (2014)] is a promising non-interferometric wavefront measurement technique. It eliminates the thin-sample requirement in typical Fourier ptychography employing angle-varying illumination. However, as aperture-scanning Fourier ptychography is based on step-by-step scanning, it requires long data acquisition time and a high-stability optical system. In this paper, we propose a single-shot aperture-scanning Fourier ptychography method. In our method, multiple low-resolution images are collected in a single shot by inserting a Dammann grating at a certain distance before the aperture, and the images are subsequently converted to a high-resolution complex wavefront. Compared with scanning-based aperture-scanning Fourier ptychography, the total acquisition time of the proposed method is dramatically reduced. The feasibility of our proposed method is demonstrated by proof-of-concept experiments.
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