Single-pixel microscopy with optical sectioning.

Abstract

Imaging with single-pixel detectors offers a valuable alternative to the conventional focal plane array strategy, especially for wavelengths where silicon-based sensor arrays exhibit lower efficiency. However, the absence of optical sectioning remains a challenge in single-pixel microscopy. In this paper, we introduce a single-pixel microscope with optical sectioning capabilities by integrating single-pixel imaging (SPI) techniques with structured illumination microscopy (SIM) methods. A spatial light modulator positioned at the microscope's input port encodes a series of structured light patterns, which the microscope focuses onto a specific plane of the 3D sample. Simultaneously, a highly sensitive bucket detector captures the light reflected by the object. Optical sectioning is achieved through a high-frequency grating positioned at the microscope's output port, which is conjugated with the spatial light modulator. Utilizing SPI reconstruction techniques and SIM algorithms, our computational microscope produces high-quality 2D images without blurred out-of-focus regions. We validate the performance of the single-pixel microscope (SPM) by measuring the axial response function and acquiring images of various 3D samples in reflected bright-field configuration. Furthermore, we demonstrate the suitability of the optical setup for single-pixel fluorescence microscopy with optical sectioning.