Single-Phase T-Type Inverter Performance Benchmark Using Si IGBTs, SiC MOSFETs and GaN HEMTs

Abstract

In this paper, benchmark of Si IGBT, SiC MOSFET, and Gallium nitride (GaN) HEMT power switches at 600-V class is conducted in single-phase T-type inverter. Gate driver requirements, switching performance, inverter efficiency performance, heat sink volume, output filter volume, and dead-time effect for each technology is evaluated. Gate driver study shows that GaN has the lowest gate driver losses above 100 kHz and below 100 kHz, SiC has lowest gate losses. GaN has the best switching performance among three technologies that allows high efficiency at high-frequency applications. GaN-based inverter operated at 160-kHz switching frequency with 97.3% efficiency at 2.5-kW output power. Performance of three device technologies at different temperature, switching frequency, and load conditions shows that heat sink volume of the converter can be reduced by 2.5 times by switching from Si to GaN solution at 60 °C case temperature, and for SiC and GaN, heat sink volume can be reduced by 2.36 and 4.92 times, respectively, by increasing heat sink temperature to 100 °C. Output filter volume can be reduced by 43% with 24, 26, and 61 W increase in device power loss for GaN-, SiC-, and Si-based converters, respectively. WBG devices allow reduction of harmonic distortion at output current from 3.5% to 1.5% at 100 kHz.