Abstract
The description of the device and procedure for the specific temperature testing and calibration of the ASIC on a general purpose ATE (automatic test equipment) is presented in the paper. The described temperature testing and calibration procedure does not require an external heating source. The temperature of the ASIC is elevated by electronic heating of the ASIC itself. In the paper the detailed description of the standard temperature calibration of the packaged ASICs is described. The main problems are outlined and the benefits of temperature testing and calibration with self-heating are presented. Measurements of several mass produced ASICs are performed and presented.
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