Single-pass magnetic force microscopy technique, with topography feedback based on scanning polarization force microscopy

Abstract

We propose the use of a hybrid scanning probe microscopy technique, which combines magnetic force microscopy with scanning polarization force microscopy, for rapid scans of relatively large areas. Topography feedback relies on maintaining a constant electric interaction between tip and sample, and is achieved by monitoring the off-resonance tip oscillation induced by electric modulation. Magnetic sensing is based on recording changes of the amplitude and phase of the cantilever’s mechanically modulated oscillation at resonance. By using electric interaction instead of van der Waals for topography feedback, the tip is held in feedback at relatively large distances from the surface – tens to hundreds of nanometers. This reduces the cross-talk between topography and magnetic signals, thus eliminating the need for two-pass scanning. Moreover, it allows imaging at higher speeds with lower risk of tip damage, opening this field to studies of dynamic phenomena. Advantages and disadvantages of this technique are discussed.