Abstract
This paper presents an analysis of dark signal nonuniformity induced in a charge coupled device (CCD) by 90 MeV neutrons. Random telegraph signal switching between multiple levels was seen for some dark current spikes. The probability distribution of the dark current spikes is shown to be pseudo-exponential and the distribution remains exponential during annealing, but with an increasing decay constant. Similar dark current spikes were also observed to be generated in an APS device exposed to high energy neutrons at the WNR facility.
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