Abstract
In recent years, significant efforts have been made to develop ultrafast laser source around 2- <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\mu \text{m}$ </tex-math></inline-formula> wavelength. Meanwhile, the characterization of the ultrashort pulses within ultracompact footprints has been attracting growing interests. Here relying on the transverse second-harmonic generation in a single CdTe microwire, we successfully demonstrate an optical autocorrelator for femtosecond pulse characterization at 2- <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\mu \text{m}$ </tex-math></inline-formula> wavelength. With 220-fs laser pulses (38 pJ/pulse) as input light, the measured pulse width after calibration is 236 fs, showing a good accuracy of this microwire autocorrelator. Due to the low-loss transmission window and high nonlinearity of CdTe in the mid-infrared (MIR) region, the microwire-based autocorrelator shows great potential for MIR applications ranging from on-chip optical communication to ultracompact laser spectroscopy.
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