Abstract

The viability and vigor of crop seeds are crucial indicators for evaluating seed quality, and high-quality seeds can increase agricultural yield. The conventional methods for assessing seed viability are time consuming, destructive, and labor intensive. Therefore, a rapid and nondestructive technique for testing seed viability has great potential benefits for agriculture. In this study, single-kernel Fourier transform near-infrared (FT-NIR) spectroscopy with a wavelength range of 1000–2500 nm was used to distinguish viable and nonviable supersweet corn seeds. Various preprocessing algorithms coupled with partial least squares discriminant analysis (PLS-DA) were implemented to test the performance of classification models. The FT-NIR spectroscopy technique successfully differentiated viable seeds from seeds that were nonviable due to overheating or artificial aging. Correct classification rates for both heat-damaged kernels and artificially aged kernels reached 98.0%. The comprehensive model could also attain an accuracy of 98.7% when combining heat-damaged samples and artificially aged samples into one category. Overall, the FT-NIR technique with multivariate data analysis methods showed great potential capacity in rapidly and nondestructively detecting seed viability in supersweet corn.

Highlights

  • Sweet corn (Zea mays L. saccharate Sturt) is one of the most popular vegetables in countries such as the United States and Canada and is becoming popular in China and other Asian countries due to its pleasant flavor and high nutritional value [1,2]

  • This study mainly aimed to verify the feasibility of using NIR spectroscopy to recognize damaged supersweet corn seeds caused by overheating and accelerated-aging treatments

  • The appropriate accuracies of the prediction models demonstrated that Fourier transform near-infrared (FT-NIR) spectroscopy with multivariate data analysis could be used to detect nonviable supersweet corn seeds that have been damaged by overheating and artificial aging, indicating that the NIR technique has great potential value in inspecting seed quality at the single-kernel level

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Summary

Introduction

Sweet corn (Zea mays L. saccharate Sturt) is one of the most popular vegetables in countries such as the United States and Canada and is becoming popular in China and other Asian countries due to its pleasant flavor and high nutritional value [1,2]. This increase in consumer popularity has resulted in an expansion of its planting scale around the world in recent years.

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