Abstract
SEUs (single event upsets) in the CRRES (Combined Release and Radiation Effects Satellite) MEP (Microelectronic Package Space Experiment) showed a dramatic increase during a solar flare, the influence of the flare varied widely among device types, and a GaAs RAM (random access memory) showed a different response to the proton belts than some 51 RAMs. Corrections to the SEU rate to account for orbital dwell time emphasize the dramatic difference between the rate in the proton belts and the rate due to cosmic ray ions above the belts. In the case of one device, apparent total dose damage resulted in a large increase in upsets due to unreliable device operation.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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