Single event effects rate predictions in space

Abstract

Computational methods for estimating single event error rates in space are reviewed. Single event effects are a source of error in spacecraft microelectronics caused by the passage of high-energy charged particles such as cosmic rays. These one- or few-bit errors may cause data loss or system malfunctions without any permanent damage to the device. Designers must be assured that errors fall below tolerable limits for their mission. Susceptibility of microelectronic devices is characterized by exposure to proton and heavy ion beams in laboratory facilities. The behavior of devices in space is generally estimated using computational models in conjunction with the accelerator data. Models of the space radiation environment include the CREME (cosmic ray effects on microelectronics) model of the galactic cosmic ray environment, the AP-8 trapped proton model, and various models of solar flare events. Radiation transport codes determine changes in the radiation environment after passage through the Earth's magnetic field and spacecraft structural materials. Semiconductor device models are used to convert particles fluxes into error rates.