Abstract
Digital holographic microscopy (DHM) is a well-known microscopy technique using an interferometric architecture for quantitative phase imaging (QPI) and it has been already implemented utilizing a large number of interferometers. Among them, single-element interferometers are of particular interest due to its simplicity, stability, and low cost. Here, we present an extremely simple common-path interferometric layout based on the use of a single one-dimensional diffraction grating for both illuminating the sample in reflection and generating the digital holograms. The technique, named single-element reflective digital holographic microscopy (SER-DHM), enables QPI and topography analysis of reflective/opaque objects using a single-shot operation principle. SER-DHM is experimentally validated involving different reflective samples.
Highlights
Digital holographic microscopy (DHM) raises from the application of digital holography to microscopy
In order to redirect the light toward the microscope lens, the illumination system must form an angle of incidence θi with respect to the optical axis of the objective, which is given by the diffraction grating equation, sin = sin + m λ N
We have proposed single-element reflective digital holographic microscopy (SER-DHM) as a valid technique for quantitative phase imaging (QPI) and topography analysis in reflective objects
Summary
Digital holographic microscopy (DHM) raises from the application of digital holography to microscopy. DHM merges high-quality imaging (microscopy), whole-object wavefront recovery (holography), and numerical processing capabilities (digital domain) [1,2,3,4]. DHM allows quantitative phase imaging (QPI) using a non-invasive, full-field, real-time, noncontact, and static working principle, at the same time that provides major advantages with respect to other microscopy techniques as the removal of the limited depth of focus in high NA lenses [5]. When DHM is implemented in a reflection modality, the phase delays of the light reflected or scattered by the sample are recovered. Those delays are directly related to the topography of the sample surface. The possibility of inspecting the topography of technical microscopic objects, which often are reflective or opaque, is of great significance in fields as important as science, technology, and industry
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