Sine-Wiener bounded noise-induced logical stochastic resonance in a two-well potential system

Abstract

Abstract Some noisy nonlinear system can be used to realize reliable logic operation based on the mechanism of logical stochastic resonance (LSR). However, most previous studies focus mainly on Gaussian noise-driven system. In this paper, the effect of non-Gaussian sine-Wiener (SW) bounded noise on the reliability and agility of logic system is explored based on a SW noise-driven two-potential well system. The success probability P of obtaining desired reliable logic operation increases quickly, reaches a maximum of P = 1, and then decrease with the increase of noise intensity or self-correlation time of SW noise, showing the occurrence of LSR. Furthermore, with increasing self-correlation time of SW noise, the optimal window of noise intensity moves toward left and becomes narrower. For too long self-correlation time, SW noise cannot induce LSR. The optimal parameter regions of SW noise are strongly dependent on bias b of logic system. Therefore, adjusting bias b can realize the control of noise and let noise produce constructive effect. Additionally, the agility of reliable logic gate can be improved by properly increasing noise intensity. Taken together, the results presented here are beneficial to the design of new logic devices based on LSR.