Abstract
We provide the simultaneous traceable measurements of microwave electric fields at two different frequencies by the electromagnetically induced transparency (EIT) and Autler–Townes (AT) splitting. A static magnetic field working together with a linearly polarized probe and coupling light prepares Rydberg atoms in Zeeman sublevels with maximal |mJ| in an atomic vapor cell. Using the EIT-AT splitting of these two maximal |mJ| states, the microwave electric fields at two different frequencies are simultaneously measured, in which their frequency difference can be adjustable within the linear range of magnetic field-induced level shifts. The proposed method provides a promising prospect for calibrating multiple microwave frequencies simultaneously in the future.
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