Abstract
A technique for the generation of ultrasonic waves from highly disorientated CdS layers results in the simultaneous excitation of both the longitudinal and transverse acoustic modes in the substrate, so providing a means for the measurement of the two associated elastic constants. This technique therefore overcomes the difficulties encountered with the usual method, where it is necessary to work with two separate transducers, and further extends the range of applications for CdS films. Experiments have so far been performed on two single-crystal samples, Al2O3 and V3Si (an A15 compound).
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