Abstract
A simultaneous measurement method of the thickness and permittivity of a thin and uniform material which is attached onto the top of a sensor structure is presented. The sensor utilizes the fundamental and harmonic frequencies of a microstrip line ring resonator structure. The thickness and permittivity of a material under test are calculated from two simultaneous equations at the fundamental and second-harmonic frequencies. Fitting equations to calculate the peak resonant frequencies with respect to the thickness and permittivity are also derived. The structure is implemented with a microstrip line on the front side of a TLY-5A substrate and coplanar waveguide access lines on the backside. The permittivity and thickness of the test material are successfully measured simultaneously.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
