Simultaneous Measurement of Microwave Doppler Frequency Shift and Angle of Arrival Based on a Silicon Integrated Chip

Abstract

A system for simultaneous measurement of micro-wave Doppler frequency shift (DFS) and angle of arrival (AOA) is proposed based on a silicon integrated chip. In the chip, two dual-drive Mach–Zehnder modulators (DDMZMs) with a microring resonator (MRR) inserted between them are integrated. When an external laser is coupled into the chip, it is first modulated by two echo signals via the first DDMZM and then goes through the MRR to introduce an optical phase shift to one of the first-order sidebands that falls into the resonance of the MRR. After being remodulated by the transmitted signal at the other DDMZM, the lightwave is coupled out from the chip and separated into two channels by an optical coupler. In each channel, a bandpass filter (BPF) is employed to select the upper and lower sidebands. By measuring and comparing the powers, frequencies, and phases of the beat signals in the two channels, the DFS (without direction ambiguity) and AOA can be acquired. Based on the proposed method, DFS within ±100 kHz at 10, 15, and 20 GHz is successfully estimated with a maximum error of ±0.028 Hz, and AOA measurement from 0° to 75° with errors less than ±1.53° is also realized.