Abstract
Simultaneous measurements of electron and ion transfers were performed in an all solid ion-transfer device made of transition metal cyanide films, indium–tin oxide (ITO)/NaxNi[Fe(CN)6]0.68·5.1H2O (NNF68)/NaxCo[Fe(CN)6]0.90·2.9H2O (NCF90)/ITO, against time (t) and temperature (T). At 330 K, the current density (I) steeply decreases below 10 s, and then becomes nearly constant above 10 s. We found that there exists time-lag between the electron and ion transfers. We analyzed the I–t curves with an equivalent circuit, which consists of the external component (Rex) of resistance, the bulk component (R') resistance, the leak current component (Rleak), and the capacitance (C). The large R' component was ascribed to suppressed current density owning to the local charge neutrality.
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