Simultaneous measurement of 3D surface and thickness of large area and thickness transparent materials based on polarization model and TOF correction

Abstract

The field of 3D reconstruction of transparent objects has always been a difficult problem. Due to its reflection and refraction effects in the propagation process and its susceptibility to the surrounding ambient light, traditional methods cannot achieve the three-dimensional reconstruction of the transparent surface. Therefore, the research on the 3D reconstruction of transparent targets has important theoretical significance and practical value. This paper proposes a method for 3D reconstruction of transparent objects based on laser continuous wave modulation and polarization characteristics, which can measure 3D surface and thickness at the same time. This method uses the normal map obtained by combining laser continuous wave modulation to correct the normal map obtained based on polarization characteristics. Compared with the two methods alone, the reconstruction accuracy has a more accurate reconstruction effect. We evaluate this method by experimenting with 30 mm transparent cylinder glass. Experiments show that the reconstruction effect is good, and the relative error of the three-dimensional reconstruction of the transparent cylinder can be as low as 0.86%, which achieves the expected goal.