Simultaneous diffraction and inelastic scattering on the backscattering instrument IN16

Abstract

The backscattering instrument IN16 at ILL was recently equipped with an additional diffraction detector bank which makes it possible to measure the diffraction pattern simultaneously with the dynamic structure factor over the same Q-range. This is very useful in cases where the scattering from a sample is not purely incoherent. The new diffraction detector can be placed below the analyser sphere or within the scattering plane. We show the layout of the instrument with its detector bank and the first results that proved the usefulness and performance in the elastic and inelastic scan modes.