Simultaneous determination of multiple trace element compositions in thin (<30.MU.m) layers of BCR-2G by 193 nm ArF excimer laser ablation-ICP-MS: implications for matrix effect and elemental fractionation on quantitative analysis

Abstract

The latest generation of quadrupole ICP-MS instruments coupled with a 193 nm ArF excimer laser system (LA-ICP-MS) allows quantitative analysis for ultra-trace elements (ppm ~ ppb) from the small amount of solid materials. Multiple trace element compositions (Li, Be, B, Sc, V, Cr, Mn, Co, Ni, Cu, Zn, Ga, Rb, Sr, Y, Zr, Nb, Mo, Cs, Ba, REE, Hf, Ta, Tl, Pb, Th and U) were simultaneously determined from thin layer ( 50 μm pit diameter. No apparent differences between the Ca-normalized measured values and the Si-normalized one were found for both BCR-2G and natural minerals (clinopyroxene and amphibole in mafic rock). The measured values of BCR-2G are in agreement (within 20%) with the previous values for most elements (within 10% for REE except for Tb), except for Zn, Ga and Pb, in spite of large differences in matrix compositions between external reference material (NIST SRM 612) and the unknown sample (BCR-2G).