Simultaneous detection of optical retardation and axis orientation by polarization-sensitive full-field optical coherence microscopy for material testing

Abstract

We present a polarization-sensitive full-field optical coherence microscopy modality which is capable of simultaneously delivering depth resolved information on the reflectivity, optical retardation and optical axis orientation. In this way local birefringence, inherent stress–strain fields and optical anisotropies can be visualized with high resolution, as exemplified for various technical material applications.