Simultaneous bidirectional test data flow for a low-cost wafer test strategy

B.G West

https://doi.org/10.1109/test.2003.1271081

Copy DOI

Publication Date: Sep 30, 2003

Citations: 10

Abstract

A two-wire test strategy with simultaneous bidirectional data flow and an independent clock line enables very high site count low-cost wafer probing.

Full Text

Paper version not known

Join us for a 30 min session where you can share your feedback and ask us any queries you have