Abstract

A novel approach to the measurement of arsenic and selenium in nail phantoms is demonstrated. Two-component nail phantoms of 0.7 mm and 1.5 mm thickness were made from a polyester resin-salt mixture and dosed with equal arsenic and selenium concentrations ranging from 0 to 30 µg g−1. A backing was made to simulate the soft tissue and bone of the great toe. Characteristic x-rays for arsenic and selenium were recorded using a portable x-ray tube and a silicon PiN diode detector. The minimum instrumental detection limits for arsenic and selenium in 0.7 mm solitary nail samples were as follows: 0.510 ± 0.018 µg g−1 and 0.519 ± 0.026 µg g−1 respectively; for 1.5 mm solitary nail: 0.465 ± 0.035 µg g−1 and 0.561 ± 0.062 µg g−1; for 0.7 mm nail with backing: 1.522 ± 0.038 µg g−1 and 1.401 ± 0.049 µg g−1; for 1.5 mm nail with backing: 1.354 ± 0.054 µg g−1 and 1.367 ± 0.068 µg g−1.

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