Simulations of embedded lateral stress gauge profiles in shocked targets

Abstract

In principle, stress gauges mounted to measure lateral stresses in a shocked matrix allow the shear strength of the material to be determined. However, interpreting the resistance profiles from lateral stress gauges is hindered by the fact that the stress field in the vicinity of the insulating layer in which the gauges are embedded can differ significantly from the stress field that would be generated in the sample if no gauge were present. A series of high resolution Eulerian hydrocode simulations have been run which suggest that the stresses in the insulating layer vary with distance and time in a way that depends on the thickness of the layer, the shock strength and the elastic and plastic properties of both the layer and the matrix. In particular, if the shock velocity in the matrix material is high the stress at a typical gauge position initially rises to a sharp peak then falls with time, but when the shock velocity in the matrix is low the stress rises relatively gradually throughout the time of interest. The shapes of the stress versus time profiles predicted by the hydrocode compare well with the results of lateral gauge experiments on several different materials. It is concluded that lateral gauges can be used to measure the dynamic strength of materials provided high resolution computer simulation is used to take account of the perturbation of the stress field in the shocked sample caused by the gauges.