Abstract
To evaluate attainable spatial resolution of phase-contrast X-ray imaging using an LLL X-ray interferometer with a thin crystal wafer, a computer simulation study with Takagi–Taupin equation was performed. Modulation transfer function of the wafer for X-ray phase was evaluated. For a polyester film whose thickness is 0.1 mm, it was concluded that the spatial resolution can be improved up to 3 μm by thinning the wafer, under our experimental condition.
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