Abstract
Muon tomography represents a new type of imaging technique that can be used in detecting high-Z materials. Monte Carlo simulations for muon scattering in different types of target materials are presented. The dependence of the detector capability to identify high-Z targets on spatial resolution has been studied. Muon tracks are reconstructed using a basic point of closest approach (PoCA) algorithm. In this article we report the development of a secondary analysis algorithm that is applied to the reconstructed PoCA points. This algorithm efficiently ascertains clusters of voxels with high average scattering angles to identify `areas of interest' within the inspected volume. Using this approach the effect of other parameters, such as the distance between detectors and the number of detectors per set, on material identification is also presented. Finally, false positive and false negative rates for detecting shielded HEU in realistic scenarios with low-Z clutter are presented.
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