Simulation on the relation of distribution of overall critical transport current to that of local one in bent-damaged Bi2223 superconducting composite tape

Abstract

The superconducting Bi2223/Ag/Ag alloy composite tape specimens with a length 6 cm, composed of a series circuit of six local elements with a length 1 cm, were bent by 0.37% and 1.0% for measurement of distributions of the overall (6 cm) and local (1 cm) critical transport current and n-value. When the damage amount was small (0.37% bending strain), the distributions of the measured local and overall critical currents were described by the three parameter Weibull distribution function, while when the damage amount was large (1.0% bending strain), those were described by the bimodal Weibull distribution function. The distributions of n-value in the diagram of n-value versus critical current for both local elements and overall specimens were expressed by the regression curve of n-value as a function of critical current and the normal distribution function for the deviation of the measured n-values from the regression curve. The experimentally measured critical current distribution and the diagram of the n-value versus critical current of the overall specimens were reproduced successfully in the computer by inputting the formulated distribution functions for the critical current and n-value of the local elements into the proposed simulation method, which used a Monte Carlo simulation method and a one-dimensional series circuit model for the generated voltage near the transition of superconducting to normal state.