Simulation of X‐ray diffractograms obtained by grazing incidence X‐ray diffraction of implanted stainless steel

Abstract

AbstractA method to interpret grazing incidence X‐ray diffractograms observed for expanded phases occurring after Mo implantation in an austenitic steel was extended to Ag and N ion implantation in austenitic or ferritic stainless steels.Theoretical X‐ray diffractograms were built taking into account the information depth profile, the implanted element concentration depth profile and a linear relationship between implanted element concentration and lattice parameter through an expansion coefficient (k). Experimental X‐ray diffractograms were adjusted to the theoretical ones. The adjustment led to the determination of k and/or ion‐implanted concentration profile as a function of depth.For Ag implantation in AISI 316 LVM and 430 stainless steels, the concentration depth profile was predicted using SRIM‐2003 computer program and confirmed by experimental measurement using RBS. The built austenite or ferrite X‐ray diffraction peaks were in good accordance with the experimental ones. k was shown to be independent on the incident angle and on the fluence but dependant on the type of initial lattice.For nitrided austenitic stainless steels, the k value was determined with N‐implanted AISI 316 LVM steel. The element concentration depth profiles and k value were determined for low‐energy high‐flux nitrogen implantation‐diffusion of AISI 304 steels. The predicted profiles were confirmed by NRA measurements. Copyright © 2008 John Wiley & Sons, Ltd.