Simulation of thermoluminescence dose response in cluster systems with deep traps

Abstract

The TL dose response was simulated within the framework of a kinetic model with cluster defects which contain electron TL-active traps and deep traps. It was shown that superlinearity of the TL dose dependence arises due to the temperature-dependent competition between the intracluster capture of electrons by deep traps and their thermal release into the conduction band. The regularities of the influence of the main parameters of the model (heating rate, activation energies of the ground and excited levels of TL-active traps) on the TL yield and nonlinearity of the dose dependence were found.