Abstract
A model is introduced in order to simulate the profiling process of a friction force microscope (FFM) tip scanning a sample surface. Starting from the equations of motion, complete friction force microscopy images as well as individual scan lines are calculated using a model potential for the tip-sample interaction which has the translational symmetry of a MoS2(001) surface. The subsequent analysis of the tip movement demonstrates the characteristic two-dimensional stick-slip behavior on the atomic scale.
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