Abstract
We present numerical simulations of scattering-type scanning near-field optical microscopy (s-SNOM) of 1D plasmonic graphene junctions. A comprehensive analysis of simulated s-SNOM spectra is performed for three types of junctions. We find conditions when the conventional interpretation of the plasmon reflection coefficients from s-SNOM measurements does not apply. Our approach can be used for other conducting 2D materials to provide a comprehensive understanding of the s-SNOM techniques for probing the local transport properties of 2D materials.
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