Abstract

The relative ease of protecting an SSC magnet following a quench and the implications of quench protection on magnet reliability and operation are necessary inputs in a rational magnet selection process. As it appears likely that the magnet selection will be made prior to full scale prototype testing, an alternative means is required to ascertain the surviveability of contending magnet types. This paper attempts to provide a basis for magnet selection by calculating the peak expected quench temperatures in the 3 T Design C magnet and the 6 T Design D magnet as a function of magnet length. A passive, ''cold diode'' protection system has been assumed. The relative merits of passive versus active protection systems have been discussed in a previous report. It is therefore assumed that - given the experience gained from the Tevatron system - that an active quench protection system can be employed to protect the magnets in the eventuality of unreliable cold diode function.

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