Abstract

The author describes a novel mixed-signal simulator, Spice-SCAN, for nonlinear transient analysis of SC (switched capacitor) A/D (analog-digital) circuits. Spice-SCAN partitions the input netlist into A/D and SC blocks. The A/D blocks are simulated by SPIC, while the SC blocks are simulated by SCAN with all the inputs and clocks dynamically supplied by SPICE. With this methodology there are no restrictions on the number of clocks, clock patterns, or input waveforms for the SC blocks. Any number of SC and analog/digital blocks with random interconnections are allowed. >

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