Abstract
The charge coupled device (CCDs) were used as image sensor for the imaging. Thereafter CMOS sensors introduced like passive pixel sensors, active pixel senor (APS) could give the advantages in the implementation, so the APS could compete with CCDs. However, APS suffered with the problem of poor resolution and fill factor, which resulted the CCD image sensor to retain popularity. The digital pixel sensor (DPS) has overcome the problems associated in APS. This gave many more advantages for effective pixel optimization. Recently, DPS came with the op-amp comparator to implement the ADC on chip for each pixel. This has definitely added advantage over the previous sensor in terms of power, pixel size and the fill factor. In this paper comparator used is modified and replaced by the CMOS inverter with proper setting of the operating point over existing DPS image sensor. In the first part the analysis for the modification is discussed while in the second part simulation results are given for the pixel implementation of the image sensor. The results are tabulated for 2 × 2 and 4 × 4 array implementation.
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